Method of forming a semiconductor device having T-shaped gate structure
US6770552B2 · kind B2 · utility
3Cited by
4References
30Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2003 |
| Grant date | Aug 3, 2004 |
| Priority date | — |
| Expiry date | Mar 27, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/518
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The cross-sectional area of polysilicon lines is increased by selectively epitaxially growing an upper portion of the polysilicon line in the presence of a dielectric layer exposing the upper portion. Thus, a substantially T-shaped line is obtained, allowing a minimum bottom-CD while insuring a sufficient high conductivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.