Patent · US Expired

Method of programming a dual cell memory device

US6775187B1 · kind B1 · utility

13Cited by
15References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 2003
Grant dateAug 10, 2004
Priority date
Expiry dateApr 24, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/0475
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of programming a dual cell memory device having a first charge storing cell and second charge storing cell. The first charge storing cell can be pre-read to determine if the first charge storing cell stores an amount of charge to increase a threshold voltage of the memory device over a specified threshold voltage. If not, the second charge storing cell can be programmed with a standard program pulse. If so, the second charge storing cell can be programed with a modified program pulse.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.