Patent · US Expired

Apparatus for and method of measuring a jitter

US6775321B1 · kind B1 · utility

12Cited by
2References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2000
Grant dateAug 10, 2004
Priority date
Expiry dateNov 2, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R29/26
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A signal under measurement is transformed into a complex analytic signal using Hilbert transformation to estimate an instantaneous phase of the signal under measurement from the complex analytic signal. A least mean square line of the instantaneous phase is calculated to obtain a linear instantaneous phase of the signal under measurement, and a zero-crossing timing of the signal under measurement is estimated using an interpolation method. Then a difference between the instantaneous phase and the linear instantaneous phase at the zero-crossing timing is calculated to estimate a timing jitter sequence. A jitter of the signal under measurement is obtained from the jitter sequence.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.