Patent · US Expired

Method for gross input leakage functional test at wafer sort

US6788095B1 · kind B1 · utility

7Cited by

4References

17Claims

0Family size

Assignee

XILINX, INC. · US

Inventors

David Mark · San Jose, US
Randy J. Simmons · San Jose, US

Key dates

Filing date	Jan 31, 2003
Grant date	Sep 7, 2004
Priority date	—
Expiry date	Jan 31, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318505
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and test configuration for performing a gross input leakage test at wafer sort is described. The method uses a pullup and pulldown on an I/O pad to inject current at the I/O pad, and, based on the resulting voltage, determines if the leakage current is excessive. The method allows an input leakage test to be performed at wafer sort without a precision measurement unit and without direct access to the I/O pad to be tested.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.