David Mark
20Patents
10h-index
22Co-inventors
75Inventor score
Filing activity: Oct 5, 1983 → Jun 13, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10656797B1 | Global event-based avatar | Electricity | 60 | Active |
| US7124338B1 | Methods of testing interconnect lines in programmable logic devices using partial reconfiguration | Physics | 55 | Expired |
| US11010022B2 | Global event-based avatar | Electricity | 50 | Active |
| US6889368B1 | Method and apparatus for localizing faults within a programmable logic device | Physics | 47 | Expired |
| US6803912B1 | Real time three-dimensional multiple display imaging system | Electricity | 27 | Expired |
| US7262623B1 | Method for gross I/O functional test at wafer sort | Physics | 14 | Expired |
| US4690242A | Sound actuated switch | Emerging Cross-Sectional Technologies | 11 | Expired |
| US7453261B1 | Method of and system for monitoring the functionality of a wafer probe site | Physics | 11 | Active |
| US7227364B1 | Test circuit for and method of identifying a defect in an integrated circuit | Physics | 11 | Expired |
| US4675034A | Dust collector | Physics | 10 | Expired |
| US7363560B1 | Circuit for and method of determining the location of a defect in an integrated circuit | Physics | 10 | Expired |
| US4740220A | Dust detection | Physics | 8 | Expired |
| US4586389A | Dust detection | Physics | 7 | Expired |
| US6788095B1 | Method for gross input leakage functional test at wafer sort | Physics | 7 | Expired |
| USD316195S | Double helix bookcase | General | 5 | Expired |
| US4616513A | Dust collection | Physics | 5 | Expired |
| US8000519B1 | Method of metal pattern inspection verification | Electricity | 5 | Active |
| US7145344B2 | Method and circuits for localizing defective interconnect resources in programmable logic devices | Physics | 4 | Expired |
| US11714524B2 | Global event-based avatar | Electricity | 1 | Active |
| US12131006B2 | Global event-based avatar | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.