Jitter measuring device and method
US6795496B1 · kind B1 · utility
77Cited by
10References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2000 |
| Grant date | Sep 21, 2004 |
| Priority date | — |
| Expiry date | Oct 5, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A signal under measurement is transformed into a complex analytic signal using a Hilbert transformer and an instantaneous phase of this analytic signal is estimated. A linear phase is subtracted from the instantaneous phase to obtain a phase noise waveform. The phase noise waveform is sampled in the proximity of a zero crossing point of a real part of the analytic signal. A differential waveform of the sample phase noise waveform is calculated to obtain a differential phase noise waveform. An RMS jitter is obtained from the phase noise waveform, and a peak-to-peak jitter is obtained from the phase noise waveform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.