Patent · US Expired

Method for producing and/or renewing an etching mask

US6806037B2 · kind B2 · utility

1Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 12, 2002
Grant dateOct 19, 2004
Priority date
Expiry dateNov 8, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/3085
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An etching mask is produced for etching a substrate by a photoresist layer being exposed such that areas which are exposed once are not yet completely exposed and, on the basis of a reflective layer which is located under the photoresist layer, additionally exposed areas are exposed completely. In consequence, a first etching mask which is used for etching a substrate can be renewed by a second etching mask in that a photoresist layer which is applied to the first etching mask or instead of the first etching mask is exposed such that areas which have been exposed once are not yet completely exposed, and areas which have been additionally exposed on the basis of a reflective layer which is located under the photoresist layer and corresponds to the first etching mask are exposed completely.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.