Patent · US Expired

High-voltage semiconductor component

US6825514B2 · kind B2 · utility

11Cited by
52References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 2003
Grant dateNov 30, 2004
Priority date
Expiry dateJun 6, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/519

Abstract

A process for manufacturing of a semiconductor device comprising a blocking pn junction, a source zone of a first conductivity type connected to a first electrode and bordering on a zone forming the blocking pn junction of a second conductivity type complementary to the first conductivity type, and a drain zone of the first conductivity type connected to a second electrode, the side of the zone of the second conductivity type facing the drain zone forming a first surface, and in the region between the first surface and a second surface located between the first surface and the drain zone, areas of the first and second conductivity type nested in one another, comprises the step of:varying in individual semiconductor layers, by doping, the degree of compensation in the regions of the second conductivity type.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.