Patent · US Expired

Semiconductor device having an interconnect that electrically connects a conductive material and a doped layer, and a method of manufacture therefor

US6828649B2 · kind B2 · utility

2Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 7, 2002
Grant dateDec 7, 2004
Priority date
Expiry dateMay 7, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a semiconductor device, a method of manufacture therefor, and an integrated circuit including the same. In one advantageous embodiment, the semiconductor device includes a doped layer located over a semiconductor substrate, and an isolation trench located in the doped layer and having a dielectric layer located on a sidewall thereof. The semiconductor device may further include a conductive material located within the isolation trench and an interconnect that electrically connects the conductive material and the doped layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.