Patent · US Expired

Triple sample sensing for magnetic random access memory (MRAM) with series diodes

US6873544B2 · kind B2 · utility

62Cited by
5References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 2003
Grant dateMar 29, 2005
Priority date
Expiry dateOct 30, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2013/0057
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A data storage device that includes an array of resistive memory cells. The resistive memory cells may include a magnetic tunnel junction (MTJ) and a thin-film diode. The device may include a circuit that is electrically connected to the array and that is also capable of monitoring a signal current flowing through a selected memory cell. Once the signal current has been monitored, the circuit is capable of comparing the signal current to an average reference current in order to determine which of a first resistance state and a second resistance state the selected memory cell is in. Also, a method for operating the data storage device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.