Reinhard Düregger
7Patents
3h-index
7Co-inventors
39Inventor score
Filing activity: Jul 18, 2001 → May 19, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6895538B2 | Method for testing a device and a test configuration including a device with a test memory | Electricity | 22 | Expired |
| US6798706B2 | Integrated circuit with temperature sensor and method for heating the circuit | Physics | 12 | Expired |
| US6590824B2 | Dynamic semiconductor memory with refresh and method for operating such a memory | Physics | 4 | Expired |
| US7428662B2 | Testing a data store using an external test unit for generating test sequence and receiving compressed test results | Physics | 3 | Expired |
| US6876217B2 | Method for testing semiconductor circuit devices | Physics | 2 | Expired |
| US6798051B2 | Connection of packaged integrated memory chips to a printed circuit board | Electricity | 1 | Expired |
| US7305525B2 | Memory system for network broadcasting applications and method for operating the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.