Patent · US Expired

Semiconductor device and method of manufacturing same

US6897570B2 · kind B2 · utility

29Cited by
1References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 9, 2003
Grant dateMay 24, 2005
Priority date
Expiry dateJan 9, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/30105
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A highly reliable semiconductor device provided herein can prevent a junction between a pad and a wire from coming off, and pads from peeling off an underlying insulating layer on the interface thereof. The semiconductor device has plugs formed in a region in which an electrode pad is formed over a substrate. The plugs protrude into the electrode pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.