Patent · US Expired

Method and apparatus for flexible atomic layer deposition

US6905547B1 · kind B1 · utility

46Cited by
24References
74Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 17, 2002
Grant dateJun 14, 2005
Priority date
Expiry dateSep 12, 2022

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/45576
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

An apparatus with a processing chamber subjects a substrate to atomic layer deposition and deposits a film layer. The processing chamber includes at least a first gas switching port. A gas switching manifold is coupled to the processing chamber and configured to mix reactants with a neutral carrier gas and provide gas switching functionality for ALD processes. An upstream gas source and pressure setting apparatus is coupled to the gas switching manifold. The upstream gas source and pressure setting apparatus includes at least a first reactant source, a second reactant source and a neutral gas source. Additionally, the upstream gas source and pressure setting apparatus is configured to provide a cascade of continuing, decreasing pressures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.