Thomas E. Seidel
31Patents
17h-index
37Co-inventors
81Inventor score
Filing activity: Dec 27, 1974 → Feb 3, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5879459A | Vertically-stacked process reactor and cluster tool system for atomic layer deposition | Chemistry; Metallurgy | 851 | Expired |
| US6503330B1 | Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition | Chemistry; Metallurgy | 463 | Expired |
| US6174377A | Processing chamber for atomic layer deposition processes | Electricity | 353 | Expired |
| US6037664A | Dual damascene interconnect structure using low dielectric constant material for an inter-level dielectric layer | Emerging Cross-Sectional Technologies | 186 | Expired |
| US6100184A | Method of making a dual damascene interconnect structure using low dielectric constant material for an inter-level dielectric layer | Emerging Cross-Sectional Technologies | 148 | Expired |
| US6638859B2 | Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition | Chemistry; Metallurgy | 117 | Expired |
| US6551399B1 | Fully integrated process for MIM capacitors using atomic layer deposition | Electricity | 93 | Expired |
| US6387185B1 | Processing chamber for atomic layer deposition processes | Electricity | 70 | Expired |
| US7981473B2 | Transient enhanced atomic layer deposition | Chemistry; Metallurgy | 57 | Expired |
| US6902624B2 | Massively parallel atomic layer deposition/chemical vapor deposition system | Chemistry; Metallurgy | 49 | Expired |
| US6905547B1 | Method and apparatus for flexible atomic layer deposition | Chemistry; Metallurgy | 46 | Expired |
| US5102816A | Staircase sidewall spacer for improved source/drain architecture | Electricity | 35 | Expired |
| US4653177A | Method of making and selectively doping isolation trenches utilized in CMOS devices | Electricity | 31 | Expired |
| US6720259B2 | Passivation method for improved uniformity and repeatability for atomic layer deposition and chemical vapor deposition | Electricity | 27 | Expired |
| US4258078A | Metallization for integrated circuits | Emerging Cross-Sectional Technologies | 24 | Expired |
| US6897119B1 | Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition | Chemistry; Metallurgy | 19 | Expired |
| US3965453A | Piezoresistor effects in semiconductor resistors | Electricity | 17 | Expired |
| US4364778A | Formation of multilayer dopant distributions in a semiconductor | Electricity | 12 | Expired |
| US4643804A | Forming thick dielectric at the bottoms of trenches utilized in integrated-circuit devices | Electricity | 10 | Expired |
| US7129580B1 | Methods and procedures for engineering of composite conductive films by atomic layer deposition | Electricity | 8 | Expired |
| US7183649B1 | Methods and procedures for engineering of composite conductive films by atomic layer deposition | Emerging Cross-Sectional Technologies | 3 | Expired |
| US6635570B1 | PECVD and CVD processes for WNx deposition | Electricity | 3 | Expired |
| US6502605B2 | Process for the production of a face-to-face carpet fabric | Textiles; Paper | 3 | Expired |
| US10896823B2 | Limited dose atomic layer processes for localizing coatings on non-planar surfaces | Physics | 2 | Active |
| US7164203B1 | Methods and procedures for engineering of composite conductive by atomic layer deposition | Emerging Cross-Sectional Technologies | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.