Apparatus for and method of measuring jitter
US6922439B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 16, 2001 |
| Grant date | Jul 26, 2005 |
| Priority date | — |
| Expiry date | Jun 21, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A signal under measurement x(t) is transformed into a complex analytic signal zc(t), and an instantaneous phase of the xc(t) is estimated using the zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform Δφ(t) of the x(t), and the Δφ(t) is sampled at a timing close to a zero-crossing timing of the x(t) to obtain a timing jitter sequence. Then a difference sequence of the timing jitter sequence is calculated to obtain a period jitter sequence. The period jitter sequence is multiplied by a ratio T0/Tk,k+1 of the fundamental period T0 of the x(t) and the sampling time interval Tk,k+1 to make a correction of the period jitter sequence. A period jitter value of the x(t) is obtained from the corrected period jitter sequence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.