Patent · US Expired

Two-mask process for metal-insulator-metal capacitors and single mask process for thin film resistors

US6933191B2 · kind B2 · utility

3Cited by
13References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 2003
Grant dateAug 23, 2005
Priority date
Expiry dateSep 18, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0274
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

MIM capacitors and thin film resistors are fabricated with at least one less lithographic step than the prior art methods. The process step reduction is realized by using semi-transparent metallic electrodes, fabricated with a two-mask process, which provides for direct alignment, and eliminates the need for alignment trenches in an additional layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.