Patent · US Expired

Etching multi-shaped openings in silicon

US6979652B2 · kind B2 · utility

13Cited by
6References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 8, 2002
Grant dateDec 27, 2005
Priority date
Expiry dateJul 7, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30655
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Openings of variable shape are made sequentially by alternately etching an opening in silicon and depositing a conformal fluorocarbon polymer on the sidewalls. This polymer protects the sidewalls of the opening from further etching. An isotropic etch can be carried out to change the profile of the etched feature, and for lift-off of the etched feature from the silicon substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.