Patent · US Expired

Fault detection spanning multiple processes

US6991945B1 · kind B1 · utility

6Cited by
1References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 30, 2002
Grant dateJan 31, 2006
Priority date
Expiry dateDec 12, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus is provided for fault detection spanning multiple processes. The method comprises receiving operational data associated with a first process, receiving operational data associated with a second process, which is downstream to the first process and performing fault detection analysis based on the operational data associated with the first process and second process using a common fault detection unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.