Brian K. Cusson
15Patents
7h-index
21Co-inventors
58Inventor score
Filing activity: Feb 18, 1999 → Jul 15, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6953697B1 | Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing same | Emerging Cross-Sectional Technologies | 44 | Expired |
| US6778873B1 | Identifying a cause of a fault based on a process controller output | Emerging Cross-Sectional Technologies | 43 | Expired |
| US6766214B1 | Adjusting a sampling rate based on state estimation results | Emerging Cross-Sectional Technologies | 38 | Expired |
| US6424876B1 | Statistical process control system with normalized control charting | Physics | 26 | Expired |
| US6740534B1 | Determination of a process flow based upon fault detection analysis | Emerging Cross-Sectional Technologies | 18 | Expired |
| US6446022B1 | Wafer fabrication system providing measurement data screening | Emerging Cross-Sectional Technologies | 12 | Expired |
| US7246290B1 | Determining the health of a desired node in a multi-level system | Physics | 8 | Expired |
| US6985825B1 | Method and apparatus for adaptive sampling based on process covariance | Emerging Cross-Sectional Technologies | 6 | Expired |
| US7031793B1 | Conflict resolution among multiple controllers | Physics | 6 | Expired |
| US6925347B1 | Process control based on an estimated process result | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6991945B1 | Fault detection spanning multiple processes | Electricity | 6 | Expired |
| US6834211B1 | Adjusting a trace data rate based upon a tool state | Emerging Cross-Sectional Technologies | 5 | Expired |
| US6800562B1 | Method of controlling wafer charging effects due to manufacturing processes | Electricity | 4 | Expired |
| US7581140B1 | Initiating test runs based on fault detection results | Emerging Cross-Sectional Technologies | 2 | Active |
| US7117062B1 | Determining transmission of error effects for improving parametric performance | Emerging Cross-Sectional Technologies | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.