Patent · US Expired

Integrated circuit including sensor to sense environmental data, method of compensating an MRAM integrated circuit for the effects of an external magnetic field, MRAM integrated circuit, and method of testing

US6999339B2 · kind B2 · utility

27Cited by
10References
41Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 22, 2003
Grant dateFeb 14, 2006
Priority date
Expiry dateJan 14, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/5006
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit includes operational circuitry; a sensor configured to sense an environmental parameter; and adjustment circuitry coupled to the sensor and to the operational circuitry and configured to affect the operational circuitry to at least partially counteract the effects of the environmental parameter. A method of testing an integrated circuit includes supporting a sensor in the integrated circuit and using the sensor to sense environmental data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.