D. Mark Durcan
69Patents
20h-index
38Co-inventors
88Inventor score
Filing activity: Feb 24, 1989 → Aug 5, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7115525B2 | Method for integrated circuit fabrication using pitch multiplication | Emerging Cross-Sectional Technologies | 455 | Expired |
| US5013680A | Process for fabricating a DRAM array having feature widths that transcend the resolution limit of available photolithography | Emerging Cross-Sectional Technologies | 322 | Expired |
| US6150253A | Controllable ovonic phase-change semiconductor memory device and methods of fabricating the same | Physics | 284 | Expired |
| US6423621B1 | Controllable ovonic phase-change semiconductor memory device and methods of fabricating the same | Physics | 234 | Expired |
| US7253118B2 | Pitch reduced patterns relative to photolithography features | Electricity | 117 | Expired |
| US6498062B2 | DRAM access transistor | Electricity | 87 | Expired |
| US5233206A | Double digitlines for multiple programming of prom applications and other anti-fuse circuit element applications | Electricity | 74 | Expired |
| US4959325A | Reduction of electric field effect in the bird's beak region of a DRAM cell following expansion of active region through local encroachment reduction | Emerging Cross-Sectional Technologies | 59 | Expired |
| US6159818A | Method of forming a container capacitor structure | Emerging Cross-Sectional Technologies | 57 | Expired |
| US7557015B2 | Methods of forming pluralities of capacitors | Emerging Cross-Sectional Technologies | 56 | Expired |
| US5177027A | Process for fabricating, on the edge of a silicon mesa, a MOSFET which has a spacer-shaped gate and a right-angled channel path | Electricity | 55 | Expired |
| US6897467B2 | Controllable ovanic phase-change semiconductor memory device | Physics | 52 | Expired |
| US7547640B2 | Method for integrated circuit fabrication using pitch multiplication | Emerging Cross-Sectional Technologies | 42 | Active |
| US6329666A | Controllable ovonic phase-change semiconductor memory device and methods of fabricating the same | Physics | 34 | Expired |
| US7651951B2 | Pitch reduced patterns relative to photolithography features | Electricity | 32 | Active |
| US7687408B2 | Method for integrated circuit fabrication using pitch multiplication | Emerging Cross-Sectional Technologies | 30 | Active |
| US6620680B2 | Method of forming a contact structure and a container capacitor structure | Electricity | 29 | Expired |
| US6999339B2 | Integrated circuit including sensor to sense environmental data, method of compensating an MRAM integrated circuit for the effects of an external magnetic field, MRAM integrated circuit, and method of testing | Physics | 27 | Expired |
| US5650349A | Process for enhancing refresh in dynamic random access memory device | Electricity | 23 | Expired |
| US6395600B1 | Method of forming a contact structure and a container capacitor structure | Electricity | 22 | Expired |
| US6294452A | Controllable ovonic phase-change semiconductor memory device and methods of fabricating the same | Physics | 20 | Expired |
| US7629693B2 | Method for integrated circuit fabrication using pitch multiplication | Emerging Cross-Sectional Technologies | 17 | Active |
| US7227774B2 | MRAM integrated circuits, MRAM circuits, and systems for testing MRAM integrated circuits | Physics | 15 | Expired |
| US8207576B2 | Pitch reduced patterns relative to photolithography features | Electricity | 14 | Active |
| US5994182A | Method of reducing outdiffusion from a doped three-dimensional polysilicon film into substrate by using angled implants | Electricity | 14 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.