Integrated test circuit in an integrated circuit
US7034559B2 · kind B2 · utility
4Cited by
6References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 17, 2004 |
| Grant date | Apr 25, 2006 |
| Priority date | — |
| Expiry date | Feb 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/16576
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an integrated test circuit in an integrated circuit for testing a plurality of internal voltages. A switching device is provided to select one of the internal voltages in accordance with a selection signal for the purpose of testing, and a comparator device is provided in order to compare a measurement voltage, dependent on the selected internal voltage, with an externally provided reference voltage. An error signal is output as a result of the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.