Laterally diffused MOS transistor having N+ source contact to N-doped substrate
US7061057B2 · kind B2 · utility
27Cited by
2References
22Claims
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Key dates
| Filing date | Jun 16, 2004 |
| Grant date | Jun 13, 2006 |
| Priority date | — |
| Expiry date | Jun 16, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/256
Abstract
Reduced source resistance is realized in a laterally diffused MOS transistor by fabricating the transistor in a P-doped epitaxial layer on an N-doped semiconductor substrate and using a trench contact for ohmically connecting the N-doped source region to the N-doped substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.