Patent · US Expired

Semiconductor device having different metal-semiconductor portions formed in a semiconductor region and a method for fabricating the semiconductor device

US7115464B2 · kind B2 · utility

2Cited by
38References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 27, 2002
Grant dateOct 3, 2006
Priority date
Expiry dateSep 27, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method for fabricating a semiconductor device different types of a metal-semiconductor compound are formed on or in at least two different conductive semiconductor regions so that for each semiconductor region the metal-semiconductor compound region may be formed to obtain an optimum overall performance of the semiconductor device. On one of the two semiconductor regions, the metal-semiconductor compound is formed of at least two different metal layers, whereas the metal-semiconductor compound in or on the other semiconductor region is formed from a single metal layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.