Apparatus for and method of measuring clock skew
US7127018B2 · kind B2 · utility
8Cited by
10References
47Claims
0Family size
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Key dates
| Filing date | Mar 20, 2001 |
| Grant date | Oct 24, 2006 |
| Priority date | — |
| Expiry date | Oct 10, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Timing jitter sequences Δφj[n] and Δφk[n] of respective clock signals under measurement xj(t) and xk(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles φ0j and φ0k of linear instantaneous phases of the xj(t) and xk(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the xj(t) and xk(t).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.