Patent · US Expired

Method for manufacturing wafer level chip scale package structure

US7170167B2 · kind B2 · utility

5Cited by
2References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 24, 2004
Grant dateJan 30, 2007
Priority date
Expiry dateJan 3, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/351
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a method for manufacturing a wafer level chip scale package structure including the following steps. After providing a glass substrate and a wafer comprising a plurality of chips, the active surface of the wafer is connected to the top surface of the glass substrate. The wafer is connected with the glass substrate through either bumps or pads thereon. After drilling the glass substrate to form a plurality of through holes, a plating process is performed to form a plurality of via plugs in the through holes. Afterwards, a singulation step is performed and a plurality of chip scale package structures is obtained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.