Method for testing an electric circuit
US7191085B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2005 |
| Grant date | Mar 13, 2007 |
| Priority date | — |
| Expiry date | Aug 29, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method for testing an electric circuit, a first circuit is produced by a first process sequence. A first signal is applied to the first circuit and a signal indicating if the first circuit is defective is generated by comparing the first signal with the first circuit output signal. Then, a second circuit is produced by a second process sequence which includes incorporating at least one intentional defect structure. The first signal is applied to the second circuit and a signal is generated by comparing the first signal with the second circuit output in response to the first signal. A modified signal is applied to the second circuit, until a comparison of the modified signal and the respective response of the second circuit indicates a defective second circuit. Information about the modified signal resulting in the indication of a defective second circuit is stored.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.