Apparatus for and method of measuring jitter
US7203229B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2001 |
| Grant date | Apr 10, 2007 |
| Priority date | — |
| Expiry date | Mar 27, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A signal under measurement is band-limited, and frequency components around a fundamental frequency of the signal under measurement are extracted. Waveform data (approximated zero-crossing data) close to zero-crossing timings of the band-limited signal are sampled, and phase error data between the approximated zero-crossing points and the corresponding zero-crossing points of the signal under measurement are calculated from the approximated zero-crossing data to obtain a zero-crossing phase error data sequence δ[k]. Then an instantaneous period sequence T(k) of the signal under measurement is obtained from the zero-crossing phase error data and sampling intervals Tk,k+1 of the approximated zero-crossing data sequence. Then a period jitter sequence is obtained from differences between the T(k) and a fundamental period T0 of the signal under measurement, and then the period jitter sequence is multiplied by T0/Tk,k+1 to correct the period jitter sequence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.