Test circuit for and method of identifying a defect in an integrated circuit
US7227364B1 · kind B1 · utility
11Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2004 |
| Grant date | Jun 5, 2007 |
| Priority date | — |
| Expiry date | Dec 16, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31855
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The embodiments of the present invention enable a new metal diagnosis pattern based on a production test pattern to quickly identify open and short circuits of metal lines which cannot be probed, such as the long lines of a programmable logic device, and to further isolates the fault location for physical failure analysis. According to one aspect of the invention, a circuit locally drives a plurality of metal long line segments to determine whether a defect in a line is a short circuit, or further to identify the location of an open circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.