Eric J. Thorne
10Patents
7h-index
25Co-inventors
62Inventor score
Filing activity: Apr 17, 2001 → Jun 14, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6996758B1 | Apparatus for testing an interconnecting logic fabric | Electricity | 31 | Expired |
| US7080300B1 | Testing a programmable logic device with embedded fixed logic using a scan chain | Electricity | 30 | Expired |
| US6594610B1 | Fault emulation testing of programmable logic devices | Physics | 22 | Expired |
| US9372956B1 | Increased usable programmable device dice | Physics | 21 | Active |
| US6983405B1 | Method and apparatus for testing circuitry embedded within a field programmable gate array | Electricity | 17 | Expired |
| US6651238B1 | Providing fault coverage of interconnect in an FPGA | Physics | 15 | Expired |
| US7227364B1 | Test circuit for and method of identifying a defect in an integrated circuit | Physics | 11 | Expired |
| US9341668B1 | Integrated circuit package testing | Physics | 1 | Active |
| US7373538B1 | Method for determining interconnect line performance within an integrated circuit | Physics | 1 | Active |
| US11099169B2 | Dual pore—control and sensor device | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.