MRAM integrated circuits, MRAM circuits, and systems for testing MRAM integrated circuits
US7227774B2 · kind B2 · utility
15Cited by
16References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2005 |
| Grant date | Jun 5, 2007 |
| Priority date | — |
| Expiry date | Nov 23, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit includes operational circuitry; a sensor configured to sense an environmental parameter; and adjustment circuitry coupled to the sensor and to the operational circuitry and configured to affect the operational circuitry to at least partially counteract the effects of the environmental parameter. A method of testing an integrated circuit includes supporting a sensor in the integrated circuit and using the sensor to sense environmental data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.