Method and system for temperature control of a substrate
US7230204B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2004 |
| Grant date | Jun 12, 2007 |
| Priority date | — |
| Expiry date | Mar 17, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/67109
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A substrate holder for supporting a substrate in a processing system and controlling the temperature thereof is described. The substrate holder comprises a first heating element positioned in a first region for elevating the temperature of the first region. A second heating element positioned in a second region is configured to elevate the temperature in the second region. Furthermore, a first controllably insulating element is positioned below the first heating element, and is configured to control the transfer of heat between the substrate and at least one cooling element positioned therebelow in the first region. A second controllably insulating element is positioned below the second heating element and is configured to control the transfer of heat between the substrate and at least one cooling element positioned therebelow in the second region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.