Patent · US Expired

Method and system for monitoring component consumption

US7233878B2 · kind B2 · utility

3Cited by
8References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 30, 2004
Grant dateJun 19, 2007
Priority date
Expiry dateFeb 6, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32963
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for monitoring consumption of a component, including the steps of emitting a radiation beam onto a first area of the component and detecting a portion of the radiation beam that is refracted by the component. A radiation level signal is generated based at least on a strength of the detected portion of the radiation beam, and a thickness of the component is determined based on the radiation level signal. The thickness of the component is compared to a predetermined thickness value, and a status signal is generated when the comparing step determines that the thickness of the component is substantially equal to or below the predetermined thickness value. When the comparing step determines that the thickness of the component is greater than the predetermined thickness value, the component is exposed to a process that can erode at least a portion of the component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.