Patent · US Expired

Microfeature workpiece processing apparatus and methods for batch deposition of materials on microfeature workpieces

US7235138B2 · kind B2 · utility

8Cited by
222References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 2003
Grant dateJun 26, 2007
Priority date
Expiry dateMay 13, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S206/832
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

The present disclosure describes apparatus and methods for processing microfeature workpieces, e.g., by depositing material on a microelectronic semiconductor using atomic layer deposition. Some of these apparatus include microfeature workpiece holders that include gas distributors. One exemplary implementation provides a microfeature workpiece holder adapted to hold a plurality of microfeature workpieces. This workpiece holder includes a plurality of workpiece supports and a gas distributor. The workpiece supports are adapted to support a plurality of microfeature workpieces in a spaced-apart relationship to define a process space adjacent a surface of each microfeature workpiece. The gas distributor includes an inlet and a plurality of outlets, with each of the outlets positioned to direct a flow of process gas into one of the process spaces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.