Method for gross I/O functional test at wafer sort
US7262623B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2003 |
| Grant date | Aug 28, 2007 |
| Priority date | — |
| Expiry date | Aug 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318505
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and test configuration for performing a gross I/O functionality test at wafer sort is described. The method uses a current injector, such as a pullup or a pulldown on an I/O pad, to inject current at the I/O pad, and based on the resulting voltage, determines if the I/O characteristics of the IC meet the performance criteria set by a manufacturer. In some embodiments, the test configuration can comprise an output buffer, which can be a tristate buffer, and/or an input buffer for verifying the performance of those components. The method and test configuration allow such tests to be performed at wafer sort without a precision measurement unit and without direct access to the I/O pad to be tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.