Patent · US Expired

Etching liquid for controlling silicon wafer surface shape and method for manufacturing silicon wafer using the same

US7288207B2 · kind B2 · utility

1Cited by
2References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 31, 2006
Grant dateOct 30, 2007
Priority date
Expiry dateJan 31, 2026

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC30B33/10
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for manufacturing a silicon wafer includes a planarizing process 13 for polishing or lapping the upperside and lowerside surfaces of a thin disk-shaped silicon wafer obtained by slicing a silicon single crystal ingot, an etching process for dipping the silicon wafer into the etching liquid wherein silica powder is dispersed uniformly in an alkali aqueous solution, thereby etching the upperside and lowerside surfaces of the silicon wafer, and a both-side simultaneous polishing process 16 for polishing the upperside and lowerside surfaces of the etched silicon wafer simultaneously or a one-side polishing process for polishing the upperside and lowerside surfaces of the etched silicon wafer one after another, in this order.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.