Measurement instrument and measurement method
US7305025B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 25, 2004 |
| Grant date | Dec 4, 2007 |
| Priority date | — |
| Expiry date | May 24, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring apparatus for measuring reliability against jitter of an electronic device, including: a jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device based on an output signal output from the electronic device according to an input signal input through a transmission line of which the transmission length is shorter than a predetermined length so that it does not generate a deterministic jitter; a jitter tolerance degradation quantity estimator operable to estimate a quantity of degradation of the jitter tolerance which deteriorates by the deterministic jitter caused in the input signal by transmission through the long transmission line when the input signal is input into the electronic device through the transmission line, of which the transmission length is longer than a predetermined length so that it may cause the deterministic jitter; a system jitter tolerance estimator operable to estimate a jitter tolerance of the electronic device and a jitter tolerance of a system including the long transmission line and the electronic device based on quantity of degradation of the jitter tolerance, is provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.