Patent · US Expired

Methods for the electrochemical deposition of copper onto a barrier layer of a work piece

US7341946B2 · kind B2 · utility

9Cited by
10References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 2003
Grant dateMar 11, 2008
Priority date
Expiry dateApr 21, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76877
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Methods are provided for electrochemically depositing copper on a work piece. One method includes the step of depositing overlying the work piece a barrier layer having a surface and subjecting the barrier layer surface to a surface treatment adapted to facilitate deposition of copper on the barrier layer. Copper then is electrochemically deposited overlying the barrier layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.