Testing device for testing electronic device and testing method thereof
US7397847B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 2004 |
| Grant date | Jul 8, 2008 |
| Priority date | — |
| Expiry date | Mar 9, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing device for testing an electronic device is provided. The testing device includes: a deterministic jitter application unit for applying deterministic jitter to a given input signal without causing an amplitude modulation component and supplying the input signal with the deterministic jitter to the electronic device; a jitter amount controller for controlling the magnitude of the deterministic jitter generated by the deterministic jitter application unit; and a determination unit for determining whether or not the electronic device is defective based on an output signal output from the electronic device in accordance with the input signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.