Patent · US Expired

Method for plasma ignition

US7422664B2 · kind B2 · utility

5Cited by
13References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 3, 2006
Grant dateSep 9, 2008
Priority date
Expiry dateFeb 3, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32009
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for igniting a plasma in a semiconductor process chamber is provided herein. In one embodiment, a method for igniting a plasma in a semiconductor substrate process chamber having an electrically isolated anode, wherein the plasma has failed to ignite upon applying a plasma ignition voltage to a cathode of the process chamber, includes the steps of reducing the magnitude of the voltage applied to the cathode; reapplying the plasma ignition voltage to the cathode; and monitoring the process chamber to determine if the plasma has ignited. The step of monitoring the process chamber may have a duration of a first period of time. The step of reducing the magnitude of the voltage applied to the cathode may have a duration of a second period of time. The steps of reducing the cathode voltage magnitude and reapplying the plasma ignition voltage may be repeated until a plasma ignites.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.