Patent · US Active

Test data analyzing system and test data analyzing program

US7424336B2 · kind B2 · utility

2Cited by

6References

6Claims

0Family size

Assignee

Hitachi High-Technologies Corporation · JP

Inventors

Makoto Ono · Chapel Hill, US
Junko Konishi · Hitachinaka, JP

Key dates

Filing date	Jul 11, 2006
Grant date	Sep 9, 2008
Priority date	—
Expiry date	Jul 11, 2026

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY02P90/80
WIPO fieldControl
WIPO sectorInstruments

Abstract

Disclosed is a test data analyzing method and system for use in estimation of a defect cause of a product, such as, an integrated circuit, a liquid crystal display, an optical transceiver, a thin film magnetic head, etc., which is fabricated through plural processes. The estimation of a defect cause is achieved by selecting a wafer number to be analyzed, reading test data, reading fabrication line data, counting frequency of machine codes by wafers, grouping test data by machine codes or frequencies, comparing test data distributions between groups by machine codes, and comparing results between machine codes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.