Makoto Ono
135Patents
20h-index
242Co-inventors
93Inventor score
Filing activity: Jan 24, 1979 → Jan 26, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5801965A | Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices | Physics | 144 | Expired |
| US5176856A | Ultrasonic wave nebulizer | Emerging Cross-Sectional Technologies | 131 | Expired |
| US5312281A | Ultrasonic wave nebulizer | Human Necessities | 115 | Expired |
| US5559944A | User specification of pull down menu alignment | Physics | 110 | Expired |
| US5299739A | Ultrasonic wave nebulizer | Emerging Cross-Sectional Technologies | 92 | Expired |
| US6075433A | Power supply unit | Emerging Cross-Sectional Technologies | 86 | Expired |
| US8607003B2 | Memory access to a dual in-line memory module form factor flash memory | Physics | 67 | Active |
| US6438438B1 | Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices | Physics | 59 | Expired |
| US7022971B2 | Laser measurement apparatus | Physics | 49 | Expired |
| US5309108A | Method of inspecting thin film transistor liquid crystal substrate and apparatus therefor | Physics | 46 | Expired |
| US5598502A | PTC heater for use in liquid with close electrical and thermal coupling between electrode plates and thermistors | Electricity | 35 | Expired |
| US5420897A | Fast reactor having reflector control system | Emerging Cross-Sectional Technologies | 33 | Expired |
| US6611728B1 | Inspection system and method for manufacturing electronic devices using the inspection system | Electricity | 32 | Expired |
| US6546308B2 | Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices | Physics | 32 | Expired |
| US6181346A | Graphics system | Physics | 27 | Expired |
| US5217165A | Ultrasonic wave nebulizer | Emerging Cross-Sectional Technologies | 27 | Expired |
| US5176958A | Modified polytetrafluoroethylene fine powder and process for preparing the same | Emerging Cross-Sectional Technologies | 25 | Expired |
| US7231079B2 | Method and system for inspecting electronic circuit pattern | Physics | 24 | Expired |
| US5588097A | Graphic display method and apparatus for rotating an object in three-dimensional space | Physics | 23 | Expired |
| US7691894B2 | Cyclohexanecarboxylic acid compound | Human Necessities | 20 | Active |
| US4482812A | Engine automatic control system for vehicles | Emerging Cross-Sectional Technologies | 19 | Expired |
| US6775817B2 | Inspection system and semiconductor device manufacturing method | Electricity | 18 | Expired |
| US6826735B2 | Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device | Physics | 18 | Expired |
| US10715411B1 | Altering networking switch priority responsive to compute node fitness | Electricity | 17 | Active |
| US7576135B2 | Diamine derivatives | Chemistry; Metallurgy | 14 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.