Method and apparatus for testing integrated circuits
US7437261B2 · kind B2 · utility
8Cited by
6References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2004 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Feb 11, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31907
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A distributed operating system for a semiconductor test system, such as automated test equipment (ATE), is described. The operating system includes a host operating system for enabling control of one or more site controllers by a system controller. One or more local operating systems, each associated with a site controller, enable control of one or more test modules by an associated site controller. Each test module performs testing on a corresponding device-under-test at a test site.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.