Patent · US Active

Method for forming tungsten materials during vapor deposition processes

US7465666B2 · kind B2 · utility

39Cited by
289References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 2007
Grant dateDec 16, 2008
Priority date
Expiry dateJun 21, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76877
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

In one embodiment, a method for forming a tungsten material on a substrate surface is provide which includes positioning a substrate within a deposition chamber, heating the substrate to a deposition temperature, and exposing the substrate sequentially to diborane and a tungsten precursor gas to form a tungsten nucleation layer on the substrate during an atomic layer deposition (ALD) process. The method further provides exposing the substrate to a deposition gas comprising hydrogen gas and the tungsten precursor gas to form a tungsten bulk layer over the tungsten nucleation layer during a chemical vapor deposition (CVD) process. Examples are provided which include ALD and CVD processes that may be conducted in the same deposition chamber or in different deposition chambers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.