Designing an integrated circuit to improve yield using a variant design element
US7487474B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2003 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Apr 5, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit is designed to improve yield when manufacturing the integrated circuit, by obtaining a design element from a set of design elements used in designing integrated circuits. A variant design element is created based on the obtained design element, where a feature of the obtained design element is modified to create the variant design element. A yield to area ratio for the variant design element is determined. If the yield to area ratio of the variant design element is greater than a yield to area ratio of the obtained design element, the variant design element is retained to be used in designing the integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.