Inventor · Belmont, CA, US

Christopher Hess

132Patents
15h-index
76Co-inventors
89Inventor score

Filing activity: Nov 17, 2000 → Jun 12, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US6834375B1 System and method for product yield prediction using a logic characterization vehicle Electricity 222 Expired
US7461043B2 Methods and apparatus to abstract events in software applications or services Physics 194 Active
US7487474B2 Designing an integrated circuit to improve yield using a variant design element Physics 175 Expired
US6901564B2 System and method for product yield prediction Electricity 127 Expired
US7751807B2 Method and system for a hosted mobile management service architecture Electricity 123 Active
USD829231S1 Display screen or portion thereof with graphical user interface General 85 Active
US8178876B2 Method and configuration for connecting test structures or line arrays for monitoring integrated circuit manufacturing Electricity 81 Active
US9496119B1 E-beam inspection apparatus and method of using the same on various integrated circuit chips Electricity 77 Active
US8484089B1 Method and system for a hosted digital music library sharing service Physics 43 Active
US7716281B2 Method and system for transferring content from the web to mobile devices Electricity 40 Active
US8417772B2 Method and system for transferring content from the web to mobile devices Physics 27 Active
US7174521B2 System and method for product yield prediction Electricity 20 Expired
US6475871B1 Passive multiplexor test structure for integrated circuit manufacturing Electricity 18 Expired
US7509320B2 Methods and apparatus to determine context relevant information Emerging Cross-Sectional Technologies 17 Active
US9799575B2 Integrated circuit containing DOEs of NCEM-enabled fill cells Electricity 17 Active
US7783645B2 Methods and apparatus to recall context relevant information Physics 14 Active
US8024400B2 Method and system for transferring content from the web to mobile devices Physics 13 Active
US9805994B1 Mesh-style NCEM pads, and process for making semiconductor dies, chips, and wafers using in-line measurements from such pads Electricity 13 Active
US7920856B2 Method and system for hosted mobile management service architecture Electricity 13 Active
US9870962B1 Integrated circuit including NCEM-enabled, interlayer overlap-configured fill cells, with NCEM pads formed from at least three conductive stripes positioned between adjacent gates Electricity 12 Active
US7902852B1 High density test structure array to support addressable high accuracy 4-terminal measurements Physics 12 Active
US7434197B1 Method for improving mask layout and fabrication Physics 12 Expired
US8972880B2 Application programming interface for transferring content from the web to devices Electricity 12 Active
US8571535B1 Method and system for a hosted mobile management service architecture Electricity 11 Active
US6787800B2 Test vehicle with zig-zag structures Physics 11 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.