Patent · US Expired

Epitaxial deposition process and apparatus

US7494545B2 · kind B2 · utility

241Cited by
10References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 3, 2006
Grant dateFeb 24, 2009
Priority date
Expiry dateFeb 3, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67069
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

An epitaxial deposition process including a dry etch process, followed by an epitaxial deposition process is disclosed. The dry etch process involves placing a substrate to be cleaned into a processing chamber to remove surface oxides. A gas mixture is introduced into a plasma cavity, and the gas mixture is energized to form a plasma of reactive gas in the plasma cavity. The reactive gas enters into the processing chamber and reacts with the substrate, forming a thin film. The substrate is heated to vaporize the thin film and expose an epitaxy surface. The epitaxy surface is substantially free of oxides. Epitaxial deposition is then used to form an epitaxial layer on the epitaxy surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.