Apparatus for measuring jitter and method of measuring jitter
US7496137B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 25, 2005 |
| Grant date | Feb 24, 2009 |
| Priority date | — |
| Expiry date | Feb 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31709
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.