Patent · US Expired

Lithographic apparatus and device manufacturing method

US7522261B2 · kind B2 · utility

3Cited by
18References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 24, 2004
Grant dateApr 21, 2009
Priority date
Expiry dateSep 24, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70341
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An immersion lithographic projection apparatus has a liquid confinement structure configured to at least partly confine liquid to a space between a projection system and a substrate, the confinement structure having a buffer surface, when in use, positioned in close proximity to a plane substantially comprising the upper surface of the substrate and of a substrate table holding the substrate, to define a passage having a flow resistance. A recess is provided in the buffer surface, the recess, when in use, being normally full of immersion liquid to enable rapid filling of a gap between the substrate and substrate table as the gap moves under the buffer surface. The recess may be annular or radial and a plurality of recesses may be provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.