Integrated circuit manufacturing method using hard mask
US7615484B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 24, 2007 |
| Grant date | Nov 10, 2009 |
| Priority date | — |
| Expiry date | Jul 4, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/76835
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
An integrated circuit hard mask processing system is provided including providing a substrate having an integrated circuit; forming an interconnect layer over the integrated circuit; applying a low-K dielectric layer over the interconnect layer; applying a hard mask layer over the low-K dielectric layer; forming a via opening through the hard mask layer and the low-K dielectric layer to the interconnect layer; applying a first fluid and a second fluid in the via opening for removing an overhang of the hard mask layer; depositing an interconnect metal in the via opening; and chemical-mechanical polishing the interconnect metal and the ultra low-K dielectric layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.