Patent · US Active

Integrated circuit manufacturing method using hard mask

US7615484B2 · kind B2 · utility

0Cited by
5References
10Claims
0Family size

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Key dates

Filing dateApr 24, 2007
Grant dateNov 10, 2009
Priority date
Expiry dateJul 4, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76835
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit hard mask processing system is provided including providing a substrate having an integrated circuit; forming an interconnect layer over the integrated circuit; applying a low-K dielectric layer over the interconnect layer; applying a hard mask layer over the low-K dielectric layer; forming a via opening through the hard mask layer and the low-K dielectric layer to the interconnect layer; applying a first fluid and a second fluid in the via opening for removing an overhang of the hard mask layer; depositing an interconnect metal in the via opening; and chemical-mechanical polishing the interconnect metal and the ultra low-K dielectric layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.